MTIS

Characterization & Testing
[dt_breadcrumbs font_style=”normal:normal:none” font_size=”13px” line_height=”16px” font_color=”#ffffff” paddings=”2px 12px 2px 12px” border_color=”rgba(255,255,255,0.25)” border_width=”1px” border_radius=”0px”]

Materials Characterisation uses a range of techniques to determine the chemical, structural, physical, thermal, electrical or mechanical properties of materials. Materials testing similarly uses a range of methods to understand how materials perform either in the laboratory or in service. Through its network of partner laboratories MTIS has access to a wide range of characterisation and testing techniques.

The techniques we use most often are shown below:

  • X-Ray Diffraction (XRD)

  • X-ray Florescence (XRF)

  • Real Time X-ray Imaging / Radiography (XI)

  • Scanning Electron Microscopy (SEM)

  • Optical Microscopy (OM)

  • Borescopy

  • Differential scanning calorimetry (DSC)

  • Full suite of Mechanical Testing

  • Dye Penetrant Inspection (DPI)

  • Micro and Macro Imaging

  • In situ metallography

  • Replication

  • Hardness testing

  • Ferrite scope

  • Atomic Absorption Spectroscopy

  • Energy Dispersive X-ray Spectroscopy (EDX/EDS)

  • Transmission Electron Microscopy (TEM)

  • Residual Stress Analysis

Recent Posts

[dt_blog_masonry dis_posts_total=”4″ content_alignment=”center” post_date=”n” post_category=”n” post_author=”n” post_comments=”n” post_content=”off” fancy_date=”y” category=”34″]
Scroll to Top